Dr. John W. Nolan
Dr. John W. Nolan has a degree in Optoelectronics from the University of Essex and a Ph.D. in Physics, specialising in Nanotechnology, from the University of Nottingham, a Post. Doc. at the National Centre for Scientific Research Democritus, Athens, Greece and worked there as a Researcher. John was Research Associate & Lecturer in Nanotechnology and Advanced Characterisation Techniques at the Eastern Macedonia & Thrace Institute of Technology, Kavala, Greece, where he is a founding member of the Hephaestus Advanced Characterisation Laboratory.
John is expert in the characterization of materials using advanced techniques such as Scanning Tunneling Microscopy, Atomic Force Microscopy and Scanning and Transmission Electron Microscopy, and software engineering for scientific applications such as spectroscopic data analysis. John is working in Advanced Nano Technologies as Digital Media and Software specialist and is also developing the use of Raman spectroscopy in multiple application areas.